Cita APA

Schwartz, B., & Schwartz, N. (1967). Measurement techniques for thin films. Electronics Division and Dielectrics and Insulation Division, Electrochemical Society.

Citación estilo Chicago

Schwartz, Bertram,, and Newton Schwartz. Measurement Techniques for Thin Films. New York: Electronics Division and Dielectrics and Insulation Division, Electrochemical Society, 1967.

Cita MLA

Schwartz, Bertram,, and Newton Schwartz. Measurement Techniques for Thin Films. New York: Electronics Division and Dielectrics and Insulation Division, Electrochemical Society, 1967.

Precaución: Estas citas no son 100% exactas.