01104nam a22001815a 4500 EEA.libagro000457 130809s1967####nyua##########000#0#eng#d 20200306120700.0 Measurement techniques for thin films / Edited by Bertram Schwartz and Newton Schwartz. New York : Electronics Division and Dielectrics and Insulation Division, Electrochemical Society, [1967] vi, 364 p. : il. ; 21 cm. Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society. Schwartz, Bertram, ed. Schwartz, Newton, ed. Electrochemical Society. Electronics Division. Electrochemical Society. Dielectrics and Insulation Division. 530.4175 AR-BbBCA BIB. AGRONOMIA 530.4175 S399 1968/0204