Cita APA

Chung, D. D. L. (1993). X-ray diffraction at elevated temperatures: A method for in situ process analysis. VCH.

Citación estilo Chicago

Chung, Deborah D. L. X-ray Diffraction At Elevated Temperatures: A Method for in Situ Process Analysis. New York: VCH, 1993.

Cita MLA

Chung, Deborah D. L. X-ray Diffraction At Elevated Temperatures: A Method for in Situ Process Analysis. New York: VCH, 1993.