Aliev, T. (2007). Digital Noise Monitoring of Defect Origin. Springer Science+Business Media, LLC.
Citación estilo ChicagoAliev, Telman. Digital Noise Monitoring of Defect Origin. Boston, MA: Springer Science+Business Media, LLC, 2007.
Cita MLAAliev, Telman. Digital Noise Monitoring of Defect Origin. Boston, MA: Springer Science+Business Media, LLC, 2007.
Precaución: Estas citas no son 100% exactas.
