Proceedings of the symposium on the degradation of electronic devices due to device operation as well as crystalline and process-induced defects... /
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| Autor Corporativo: | |
|---|---|
| Formato: | Libro |
| Idioma: | English |
| Publicado: |
Pennington,
1994.
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| Series: | Proceedings, v. 94-1
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| Materias: | |
| Etiquetas: |
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| LEADER | 00702nam a22001935a 4500 | ||
|---|---|---|---|
| 001 | EUN.um020185 | ||
| 003 | AR-BaUNS | ||
| 005 | 20050623122900.0 | ||
| 008 | 041125s1994####xxua##########000#0#eng#d | ||
| 245 | 1 | 0 | |a Proceedings of the symposium on the degradation of electronic devices due to device operation as well as crystalline and process-induced defects... / |c Electrochemical society. |
| 260 | |a Pennington, |c 1994. | ||
| 300 | |a 319 p. : |b ilus. ; |c 23 cm. . | ||
| 490 | 0 | |a Proceedings, v. 94-1 | |
| 020 | |a 1566770378 | ||
| 082 | 0 | 4 | |a 620.112 |
| 653 | |a Corrosion | ||
| 653 | |a Materiales ing. | ||
| 110 | 2 | |a Electrochemical society |c Princeton. | |
| 859 | |a Ar-BaUNS |b BIB. CENTRAL - Sector C |h 620.112 |i El25-4 |p 104003/994 | ||