Understanding robust and exploratory data analysis /
Guardado en:
| Otros Autores: | , , |
|---|---|
| Formato: | Libro |
| Idioma: | English |
| Publicado: |
New York :
Wiley,
c1983.
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| Series: | Wiley series in probability and mathematical statistics. Applied probability and statistics,
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| Materias: | |
| Acceso en línea: | Tabla de contenido |
| Etiquetas: |
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Tabla de Contenidos:
- John D. Emerson and David C. Hoaglin, Stem-and-leaf displays
- David C. Hoaglin, Letter values: a set of selected order statistics
- John D. Emerson and Judith Strenio, Boxplots and batch comparison
- John D. Emerson and Michael A. Stoto, Transforming data
- John D. Emerson and David C. Hoaglin, Resistant lines for $y$ versus $x$
- John D. Emerson and David C. Hoaglin, Analysis of two-way tables by medians
- Colin Goodall, Examining residuals
- John D. Emerson, Mathematical aspects of transformation
- David C. Hoaglin, Frederick Mosteller and John W. Tukey, Introduction to more refined estimators
- James L. Rosenberger and Miriam Gasko, Comparing location estimators: trimmed means, medians, and trimean
- Colin Goodall, $M$-estimators of location: an outline of the theory
- Boris Iglewicz, Robust scale estimators and confidence intervals for location.