Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 1114, 2005, Oxford, UK /
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| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Electrónico |
| Idioma: | English |
| Publicado: |
Berlin, Heidelberg :
Springer-Verlag Berlin Heidelberg,
2005.
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| Series: | Springer Proceedings in Physics,
107 |
| Materias: | |
| Acceso en línea: | SpringerLink, via BECYT |
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| LEADER | 01147nmm a22003015u 4500 | ||
|---|---|---|---|
| 001 | springer.978-3-540-31914-6 | ||
| 003 | Springer | ||
| 005 | 20100326152930.0 | ||
| 007 | cr#nn#008mamaa | ||
| 008 | 100301s2005 xx j eng#d | ||
| 020 | |a 9783540319153 | ||
| 100 | 1 | |a Cullis, A. G. | |
| 245 | 1 | 0 | |a Microscopy of Semiconducting Materials |h [electronic resource] : |b Proceedings of the 14th Conference, April 1114, 2005, Oxford, UK / |c edited by A. G. Cullis, J. L. Hutchison. |
| 260 | |a Berlin, Heidelberg : |b Springer-Verlag Berlin Heidelberg, |c 2005. | ||
| 300 | |b v.: digital | ||
| 440 | 0 | |a Springer Proceedings in Physics, |x 0930-8989 ; |v 107 | |
| 650 | 0 | |a Chemistry | |
| 650 | 0 | |a Weights and measures | |
| 650 | 0 | |a Particles (Nuclear physics) | |
| 650 | 0 | |a Electronics | |
| 650 | 1 | 4 | |a Chemistry |
| 650 | 2 | 4 | |a Materials Science |
| 650 | 2 | 4 | |a Solid State Physics and Spectroscopy |
| 650 | 2 | 4 | |a Measurement Science, Instrumentation |
| 650 | 2 | 4 | |a Electronics and Microelectronics, Instrumentation |
| 700 | 1 | |a Hutchison, J. L. | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 856 | 4 | 0 | |u http://dx.doi.org/10.1007/3-540-31915-8 |y SpringerLink, via BECYT |