The physics of SiO2 and its interfaces : proceedings of the International Topical Conference on the Physics of Si02 and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 /

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Autor Corporativo: International Topical Conference on the Physics of SiO2 and Its Interfaces Yorktown Heights, N.Y.)
Otros Autores: Pantelides, Sokrates T., (Editor , ed.)
Formato: Libro
Idioma:English
Publicado: New York : Pergamon Press, c1978.
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245 1 4 |a The physics of SiO2 and its interfaces :  |b proceedings of the International Topical Conference on the Physics of Si02 and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 /  |c editor, Sokrates T. Pantelides. 
260 |a New York :  |b Pergamon Press,  |c c1978. 
300 |a xi, 488 p. :  |b il. ;  |c 27 cm. 
504 |a Incluye referencias bibliográficas e índice. 
020 |a 0080230490 
111 2 |a International Topical Conference on the Physics of SiO2 and Its Interfaces  |d (1978 :  |c Yorktown Heights, N.Y.) 
700 1 |a Pantelides, Sokrates T.,  |e ed.  |4 edt 
082 0 0 |a 546/.683/2 
650 4 |a Silicona  |x Congresos. 
650 4 |a Superficies (Fisica)  |x Congresos. 
650 4 |a Química de superficies  |x Congresos. 
650 0 |a Silica  |x Congresses. 
650 0 |a Surfaces (Physics)  |x Congresses. 
650 0 |a Surface chemistry  |x Congresses. 
010 |a  78018205  
040 |a DLC  |c DLC  |d AR-BbSID 
859 |a AR-BbSID  |b BIB. PLAPIQUI  |h 546.683 2  |i In 8  |p 1834