Measurement techniques for thin films /
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| Autores Corporativos: | , |
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| Formato: | Libro |
| Idioma: | English |
| Publicado: |
New York :
Electronics Division and Dielectrics and Insulation Division, Electrochemical Society,
[1967]
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| descripción de la copia: | Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society. |
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| Descripción Física: | vi, 364 p. : il. ; 21 cm. |